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VLSI test principles and architectures : design for testability

By: Material type: TextTextPublication details: New York Elsevier 2006Description: 777 pISBN:
  • 9780123705976
DDC classification:
  • 621.395 WAN
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Holdings
Item type Current library Collection Call number Status Date due Barcode
Reference Reference Mahindra University VNLRC General Stacks ECE 621.395 WAN (Browse shelf(Opens below)) Checked out Not for loan 27/10/2023 15911

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