000 00386 a2200157 4500
020 _a9783527340910
082 _a540
_bLAN
100 _aLanza,Mario
245 _aConductive atomic force microscopy
260 _bWiley
_c2017
_aWeinheim
300 _axix,361p.
650 _aAtomic force microscopy
650 _aTechnology and engineering
700 _aLanza, Mario
942 _cBK
999 _c7847
_d7847