000
00310nam a22001213i 4500
020
_a
9781316343098
082
_a
621.38413
_b
WAL
100
1
_a
Wallis, T. Mitch,
245
1
0
_a
Measurement Techniques for Radio Frequency Nanoelectronics
260
_a
New Delhi
_b
Cambridge
_c
2017
300
_a
328 p.
942
_c
BK
999
_c
7204
_d
7204