000 00311nam a22001217a 4500
020 _a9780123705976
082 _a621.395
_bWAN
100 _aWang, Laung-Terng
245 _aVLSI test principles and architectures : design for testability
260 _aNew York
_bElsevier
_c2006
300 _a777 p.
942 _cBK
999 _c13710
_d13710