TY  - GEN
AU  - Lanza,Mario
AU  - Lanza, Mario 
TI  - Conductive atomic force microscopy  
SN  - 9783527340910
U1  - 540 
PY  - 2017///
CY  - Weinheim
PB  - Wiley 
KW  - Atomic force microscopy
KW  - Technology and engineering
ER  -